102nd International Association for Identification (IAI) International Educational Conference (2017)

07-11-08.2017

Atlanta, GA, USA

 

A 3D-scanning workshop for both 3D-scanning and 3D data analysis was held with two 3D-Forensics/FTI system protopyes. An accompanying presentaion is available as is further data processsed with scans made in preparation and during the workshop.

A lecture was also given on “Expert opinion evidence based on new CSI scanning technology – legal duties and quality requirements” for England and Wales, United Kingdom.

“The IAI Annual Educational Conference is the largest organized event in the world for education and training in the fields of Latent Print, Footwear and Tire Track, Blood Stain Pattern, Forensic Art, Facial Identification, Biometric and Crime Scene Evidence.”

(International Association for Identification, 103rd International Association for Identification (IAI) International Educational Conference, (2018), [Online]. Available at: https://www.eiseverywhere.com/ehome/103rdiaiconf/664420/?t=8f6c8c4d65a5efdea03eb3f09e910a11 [Last accessed 16 May 2019]).

Opening ceremony at IAI 2017
Setting-up the 3D-Forensics/FTI workshop
Ready to go!