Conference SPIE Optical Metrology (2017)

28.06.2017

Munich, Germany

 

The 3D-Forensics/FTI system was presented at the conference. This included identifying its potential for use in the digitization of art objects in museums and for digital cultural heritage preservation. The conference paper is included in the conference proceedings: Link to publication on website of SPIE The international society for optics and photonics.

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